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i2008”N9ŒŽC—¹E‹A‘j |
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ÝÐ@@@@2006/October/1`2008/September/31
ŠwˆÊ˜_•¶@@@@Electronic Structure and Transport of Snterminated Silicon SurfaceiCŽm˜_•¶j
Œ»Š‘®
“Še˜_•¶
- T. Hirahara, T. Komorida, Y. Gu, F. Nakamura, H. Izuchi, H. Morikawa, and S.
Hasegawa:
Insulating conduction in Sn/Si(111):
Possibility of a Mott insulating ground state and metallization/localization
induced by carrier doping, Phys. Rev. B 80, 235419 (Dec,
2009).
Šw‰ï”•\
- Y. Gu,T.
Hirahara, H. Morikawa, S.
Hasegawa:
An
insulating ground state of Si(111) ã3~ã3-Sn revealed by micro-four-pointprobe
conductivity measurements,
The 4th Vacuum and
Surface Sciences Conference of Asia and Australia (VASSCAA-4), 2008”N10ŒŽ29“úA¼].
- Y. Gu,T.
Hirahara, H. Morikawa, S.
Hasegawa:
An
insulating ground state of Si(111) ã3~ã3-Sn revealed by micro-four-pointprobe
conductivity measurements,
International Symposium on
Surface Science and Nanotechnology (ISSS-5), 2008”N11ŒŽ12“úA‘ˆî“c‘åŠw.
- Yan GuC•½Œ´“OC’·’JìCŽi:
•\–Êó‘Ô“d‹C“`“±‘ª’è‚É‚æ‚éSn/Si(111)‚ÌŠî’êó‘Ô‚ÌŒ¤‹†,
“ú–{•¨—Šw‰ï2008H‹G‘å‰ï2008”N9ŒŽ22“úAŠâŽè‘åŠw.
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