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ÝÐ@@@@ 2006/April/1`2008/March/31
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- T. Shibasaki, N. Nagamura, T. Hirahara, .H. Okino, S. Yamazaki, W. Lee, H. Shim, R.
Hobara, I. Matsuda, G. . S. Lee, and S. Hasegawa:
Phase transition temperatures determined by different experimental
methods: Si(111)4x1-In surface with defects, Phys. Rev. B81,
035314 (Jan, 2010).
Šw‰ï”•\
- T. Shibasaki, H. Okino,
Y. H. Kim, G. S. Lee, T. Hirahara, and S. Hasegawa:
Influence of impurities on electrical properties of
atomic wire self-assembled on silicon surface
The 9th
International Conference on Atomically Controlled Surfaces, Interfaces and
Nanostructures (ACSIN-9), 2007”N11ŒŽ12“ú(“Œ‘å¶ŽYŒ¤j.
- ŽÅè„‹C‰«–ì‘×”VCŽR莘YCY.K.
KimAC‰i‘º’¼‰ÀC•½Œ´“OC¼“cŠÞCG. S. LeeC’·’JìCŽi:
Si(111)4~1-In•\–Ê‚Ì‘Š“]ˆÚ‚ÆŒ‡Š×‚ÌŒø‰Ê,
“ú–{•¨—Šw‰ï‘æ63‰ñ”NŽŸ‘å‰ï 2008”N3ŒŽ24“úA‹ß‹E‘åŠw.
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