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  1. T. Shibasaki, N. Nagamura, T. Hirahara, .H. Okino, S. Yamazaki, W. Lee, H. Shim, R. Hobara, I. Matsuda, G. . S. Lee, and S. Hasegawa:
    Phase transition temperatures determined by different experimental methods: Si(111)4x1-In surface with defects,
    Phys. Rev. B81, 035314 (Jan, 2010).

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  1. T. Shibasaki, H. Okino, Y. H. Kim, G. S. Lee, T. Hirahara, and S. Hasegawa:
    Influence of impurities on electrical properties of atomic wire self-assembled on silicon surface
    The 9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-9), 2007”N11ŒŽ12“ú(“Œ‘吶ŽYŒ¤j.


  2. ŽÅè„‹C‰«–ì‘×”VCŽRèŽ˜YCY.K. KimAC‰i‘º’¼‰ÀC•½Œ´“OC¼“cŠÞCG. S. LeeC’·’JìCŽi:
    Si(111)4~1-In•\–Ê‚Ì‘Š“]ˆÚ‚ÆŒ‡Š×‚ÌŒø‰Ê,
    “ú–{•¨—Šw‰ï‘æ63‰ñ”NŽŸ‘å‰ï 2008”N3ŒŽ24“úA‹ß‹E‘åŠw
    .